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Three-dimensional near-field analysis through peak force scattering-type near-field optical microscopy.
- Source :
- Nanoscale; 1/21/2020, Vol. 12 Issue 3, p1817-1825, 9p
- Publication Year :
- 2020
Details
- Language :
- English
- ISSN :
- 20403364
- Volume :
- 12
- Issue :
- 3
- Database :
- Complementary Index
- Journal :
- Nanoscale
- Publication Type :
- Academic Journal
- Accession number :
- 141362436
- Full Text :
- https://doi.org/10.1039/c9nr08417g