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A versatile Johansson-type tender x-ray emission spectrometer.

Authors :
Nowak, S. H.
Armenta, R.
Schwartz, C. P.
Gallo, A.
Abraham, B.
Garcia-Esparza, A. T.
Biasin, E.
Prado, A.
Maciel, A.
Zhang, D.
Day, D.
Christensen, S.
Kroll, T.
Alonso-Mori, R.
Nordlund, D.
Weng, T.-C.
Sokaras, D.
Source :
Review of Scientific Instruments; Mar2020, Vol. 91 Issue 3, p1-12, 12p, 2 Diagrams, 8 Graphs
Publication Year :
2020

Abstract

We present a high energy resolution x-ray spectrometer for the tender x-ray regime (1.6–5.0 keV) that was designed and operated at Stanford Synchrotron Radiation Lightsource. The instrument is developed on a Rowland geometry (500 mm of radius) using cylindrically bent Johansson analyzers and a position sensitive detector. By placing the sample inside the Rowland circle, the spectrometer operates in an energy-dispersive mode with a subnatural line-width energy resolution (∼0.32 eV at 2400 eV), even when an extended incident x-ray beam is used across a wide range of diffraction angles (∼30° to 65°). The spectrometer is enclosed in a vacuum chamber, and a sample chamber with independent ambient conditions is introduced to enable a versatile and fast-access sample environment (e.g., solid/gas/liquid samples, in situ cells, and radioactive materials). The design, capabilities, and performance are presented and discussed. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00346748
Volume :
91
Issue :
3
Database :
Complementary Index
Journal :
Review of Scientific Instruments
Publication Type :
Academic Journal
Accession number :
142513920
Full Text :
https://doi.org/10.1063/1.5121853