Multicycle Broadside and Skewed-Load Tests for Test Compaction.

This paper describes a test compaction procedure that combines the advantages of using multicycle tests for test compaction with the advantages of using both broadside and skewed-load tests for increasing the fault coverage and achieving test compaction. The procedure is the first to combine these two concepts in a single procedure. The combination is made possible by a definition of a multicycle skewed-load test that is suggested in this paper, and complements the definition of a multicycle broadside test. Experimental results demonstrate the effectiveness of multicycle broadside and skewed-load tests in achieving test compaction for benchmark circuits. [ABSTRACT FROM AUTHOR]