In-situ fabrication and transport properties of (111) Y2Ir2O7 epitaxial thin film.

We report on the successful fabrication of (111) oriented thin films of pyrochlore iridate Y₂Ir₂O₇ by means of solid phase epitaxy. Essentially, we developed an entirely in situ annealing protocol, which is superior to the conventional ex-situ routine that requires multi-hour annealing to stabilize the proper pyrochlore structure. The morphological quality of the films has been confirmed by x-ray diffraction, reflectivity, and reciprocal space mapping, demonstrating their high crystallinity with a pure pyrochlore phase and an expected epitaxial relation to the substrate. Strikingly, below the magnetic phase transition, the temperature dependence of resistivity shows a power-law behavior with the power exponent of ∼3/2, characteristic of a Weyl semimetal in the presence of impurities and electron–electron correlations. Below 10 K, the magneto-transport measurements reveal the emergence of a non-saturated negative magnetoresistance up to 9 T with a small "valley" around zero field. These findings are further interpreted in relation to the weak anti-localization effect and the non-collinear antiferromagnetic ordering on the Ir sublattice. [ABSTRACT FROM AUTHOR]