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Quantification of Bonded Ni Atoms for Ni-MoS2 Metallic Contact through X-ray Photoemission Electron Microscopy.
- Source :
- Microscopy & Microanalysis; 2018 Supplement2, Vol. 24, p458-459, 2p
- Publication Year :
- 2018
Details
- Language :
- English
- ISSN :
- 14319276
- Volume :
- 24
- Database :
- Complementary Index
- Journal :
- Microscopy & Microanalysis
- Publication Type :
- Academic Journal
- Accession number :
- 145260949
- Full Text :
- https://doi.org/10.1017/S1431927618014526