Cite
Characterization of Static and Dynamic Behavior of 1200 V Normally off GaN/SiC Cascode Devices.
MLA
Wang, Yuru, et al. “Characterization of Static and Dynamic Behavior of 1200 V Normally off GaN/SiC Cascode Devices.” IEEE Transactions on Industrial Electronics, vol. 67, no. 12, Dec. 2020, pp. 10284–94. EBSCOhost, https://doi.org/10.1109/TIE.2019.2959512.
APA
Wang, Y., Lyu, G., Wei, J., Zheng, Z., He, J., Lei, J., & Chen, K. J. (2020). Characterization of Static and Dynamic Behavior of 1200 V Normally off GaN/SiC Cascode Devices. IEEE Transactions on Industrial Electronics, 67(12), 10284–10294. https://doi.org/10.1109/TIE.2019.2959512
Chicago
Wang, Yuru, Gang Lyu, Jin Wei, Zheyang Zheng, Jiabei He, Jiacheng Lei, and Kevin J. Chen. 2020. “Characterization of Static and Dynamic Behavior of 1200 V Normally off GaN/SiC Cascode Devices.” IEEE Transactions on Industrial Electronics 67 (12): 10284–94. doi:10.1109/TIE.2019.2959512.