Exploring the Impact of Random Telegraph Noise-Induced Accuracy Loss on Resistive RAM-Based Deep Neural Network.

MLA

Du, Yide, et al. “Exploring the Impact of Random Telegraph Noise-Induced Accuracy Loss on Resistive RAM-Based Deep Neural Network.” IEEE Transactions on Electron Devices, vol. 67, no. 8, Aug. 2020, pp. 3335–40. EBSCOhost, https://doi.org/10.1109/TED.2020.3002736.

APA

Du, Y., Jing, L., Fang, H., Chen, H., Cai, Y., Wang, R., Zhang, J., & Ji, Z. (2020). Exploring the Impact of Random Telegraph Noise-Induced Accuracy Loss on Resistive RAM-Based Deep Neural Network. IEEE Transactions on Electron Devices, 67(8), 3335–3340. https://doi.org/10.1109/TED.2020.3002736

Chicago

Du, Yide, Linglin Jing, Hui Fang, Haibao Chen, Yimao Cai, Runsheng Wang, Jianfu Zhang, and Zhigang Ji. 2020. “Exploring the Impact of Random Telegraph Noise-Induced Accuracy Loss on Resistive RAM-Based Deep Neural Network.” IEEE Transactions on Electron Devices 67 (8): 3335–40. doi:10.1109/TED.2020.3002736.