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A review of OSEK/VDX application verification methods.

Authors :
Zhang, Xueping
Lu, Faming
Cui, Minghao
Source :
ACM International Conference Proceeding Series; 11/15/2019, p37-42, 6p
Publication Year :
2019

Details

Language :
English
Database :
Complementary Index
Journal :
ACM International Conference Proceeding Series
Publication Type :
Conference
Accession number :
145930684
Full Text :
https://doi.org/10.1145/3369985.3370003