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In-process metrology for segmented optics UV curing control.

Authors :
Kim, Dae Wook
Rascher, Rolf
Choi, Heejoo
Esparza, Marcos A.
Lamdan, Ariel
Feng, Yi-Ting
Milster, Tom
Apai, Daniel
Source :
Proceedings of SPIE; 7/3/2020, Vol. 11487, p114870M-114870M-7, 1p
Publication Year :
2020

Details

Language :
English
ISSN :
0277786X
Volume :
11487
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
146083023
Full Text :
https://doi.org/10.1117/12.2569310