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Breakdown Degradation Associated with Elementary Screw Dislocations in 4H-SiC P+N Junction Rectifiers.

Authors :
Neudeck, P. G.
Huang, W.
Dudley, M.
Source :
MRS Online Proceedings Library; 1997, Vol. 483 Issue 1, p285-294, 10p
Publication Year :
1997

Details

Language :
English
ISSN :
19464274
Volume :
483
Issue :
1
Database :
Complementary Index
Journal :
MRS Online Proceedings Library
Publication Type :
Conference
Accession number :
146890602
Full Text :
https://doi.org/10.1557/PROC-483-285