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Influence of Structural Defects and Zinc Composition Variation on the Device Response of Cdl-xZnxTe Radiation Detectors.

Authors :
Yoon, H.
Scyoc, J. M. Van
Gilbert, T. S.
Goorsky, M. S.
Brunett, B. A.
Lund, J. C.
Hermon, H.
Schiebert, M.
James, R. B.
Source :
MRS Online Proceedings Library; 1997, Vol. 487 Issue 1, p115-120, 6p
Publication Year :
1997

Details

Language :
English
ISSN :
19464274
Volume :
487
Issue :
1
Database :
Complementary Index
Journal :
MRS Online Proceedings Library
Publication Type :
Conference
Accession number :
146934654
Full Text :
https://doi.org/10.1557/PROC-487-115