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Lock-in carrierography non-destructive imaging of silicon wafers and silicon solar cells.
- Source :
- Journal of Applied Physics; 11/14/2020, Vol. 128 Issue 18, p1-12, 12p
- Publication Year :
- 2020
-
Abstract
- Carrier transport and electrical properties are relevant to the performance of semiconductor materials and photovoltaic devices. In recent years, various kinds of high-resolution luminescence-based methods have been proposed to image these properties. Lock-in carrierography (LIC), as a dynamic photoluminescence-based method, has the advantages of self-calibration, higher signal to noise ratio than dc or transient modalities, and high-frequency imaging ability. At the present stage of development, LIC has evolved into homodyne lock-in carrierography and heterodyne lock-in carrierography. In this Perspective, we discuss the principles and theoretical background of both LIC modalities and review experimental systems and methods. In addition, we also provide a brief overview of key LIC applications and future outlook. [ABSTRACT FROM AUTHOR]
- Subjects :
- SILICON solar cells
SILICON wafers
SIGNAL-to-noise ratio
SEMICONDUCTOR materials
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 128
- Issue :
- 18
- Database :
- Complementary Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 146969514
- Full Text :
- https://doi.org/10.1063/5.0022852