The Role of Charged Defects In Current Transport Through Hydrogenated Amorphous Silicon Alloys.

Details

Language :

English

ISSN :

19464274

Volume :

507

Issue :

1

Database :

Complementary Index

Journal :

MRS Online Proceedings Library

Publication Type :

Conference

Accession number :

146993090

Full Text :

https://doi.org/10.1557/PROC-507-655