A Smoothed Raster Scanning Trajectory Based on Acceleration-Continuous B-Spline Transition for High-Speed Atomic Force Microscopy.

MLA

Li, Linlin, et al. “A Smoothed Raster Scanning Trajectory Based on Acceleration-Continuous B-Spline Transition for High-Speed Atomic Force Microscopy.” IEEE/ASME Transactions on Mechatronics, vol. 26, no. 1, Feb. 2021, pp. 24–32. EBSCOhost, https://doi.org/10.1109/TMECH.2020.2995156.

APA

Li, L., Huang, J., Aphale, S. S., & Zhu, L. (2021). A Smoothed Raster Scanning Trajectory Based on Acceleration-Continuous B-Spline Transition for High-Speed Atomic Force Microscopy. IEEE/ASME Transactions on Mechatronics, 26(1), 24–32. https://doi.org/10.1109/TMECH.2020.2995156

Chicago

Li, Linlin, Jie Huang, Sumeet S. Aphale, and LiMin Zhu. 2021. “A Smoothed Raster Scanning Trajectory Based on Acceleration-Continuous B-Spline Transition for High-Speed Atomic Force Microscopy.” IEEE/ASME Transactions on Mechatronics 26 (1): 24–32. doi:10.1109/TMECH.2020.2995156.