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Leakage current characteristics of SrTiO3/LaNiO3/Ba0.67Sr0.33TiO3/SrTiO3 heterostructure thin films.
- Source :
- Rare Metals; Apr2021, Vol. 40 Issue 4, p961-967, 7p
- Publication Year :
- 2021
-
Abstract
- There is an urgent demand to explore new approaches of improving the electric breakdown strength of the ferroelectric thin-film capacitor without the degradation of the high dielectric constant. In this work, LaNiO<subscript>3</subscript>/Ba<subscript>0.67</subscript>Sr<subscript>0.33</subscript>TiO<subscript>3</subscript> (LNO/BST) thin film and SrTiO<subscript>3</subscript>(STO)/LNO/BST/SrTiO<subscript>3</subscript> (STO) were prepared by using radio frequency (RF) magnetron sputtering technique and ultrathin STO insulator layers were inserted between the LNO/BST and metal electrodes (Au or Pt) to improve the electric breakdown strength and the leakage current of the LNO/BST thin film. X-ray diffraction (XRD) and scanning electron microscopy (SEM) investigations revealed that these multilayer thin films show compact, smooth and uniform morphologies. The leakage current density of STO/LNO/BST/STO thin film was decreased by one order of magnitude and breakdown strength of STO/LNO/BST/STO thin film was enhanced from 0.72 to 1.26 MV·cm<superscript>−1</superscript> compared with that of LNO/BST thin film. Moreover, the dielectric constant of the STO/LNO/BST/STO thin film keeps at the same level as that of LNO/BST thin film, and dielectric loss of the STO/LNO/BST/STO thin film was decreased slightly compared with that of LNO/BST thin film. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 10010521
- Volume :
- 40
- Issue :
- 4
- Database :
- Complementary Index
- Journal :
- Rare Metals
- Publication Type :
- Academic Journal
- Accession number :
- 149150501
- Full Text :
- https://doi.org/10.1007/s12598-020-01497-z