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PRESERVE: Static Test Compaction that Preserves Individual Numbers of Tests.
- Source :
- IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; Apr2021, Vol. 40 Issue 4, p803-807, 5p
- Publication Year :
- 2021
-
Abstract
- A comprehensive test set targets faults of different types to ensure that defects of different types are detected. When test compaction is carried out for such a test set, it is advantageous if the compacted test set contains a compact test set for each fault type separately. In this case, if one (or more) of the fault types is found to be more important to detect, a compact test set for it can be extracted without further processing. This article describes the first test compaction procedure for transition and stuck-at faults, where by construction, the compact test set contains compact test sets for each fault type separately. The experimental results for benchmark circuits demonstrate the ability to compact a comprehensive test set under this condition. [ABSTRACT FROM AUTHOR]
- Subjects :
- INTEGRATING circuits
Subjects
Details
- Language :
- English
- ISSN :
- 02780070
- Volume :
- 40
- Issue :
- 4
- Database :
- Complementary Index
- Journal :
- IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems
- Publication Type :
- Academic Journal
- Accession number :
- 149510208
- Full Text :
- https://doi.org/10.1109/TCAD.2020.3005371