A 0.003-mm2 440fsRMS-Jitter and −64dBc-Reference-Spur Ring-VCO-Based Type-I PLL Using a Current-Reuse Sampling Phase Detector in 28-nm CMOS.

This paper presents a linear current-reuse sampling phase detector for a single-loop type-I phase-locked loop (PLL) to simultaneously achieve a wide loop bandwidth and low control voltage ripple, resulting in low RMS jitter and reference spur, while minimizing the chip area by avoiding an explicit loop filter. Fabricated in 28-nm CMOS, the PLL prototype measures an integrated jitter of 440 fsRMS, and a spur level of −63.9 dBc at 3.296 GHz. It draws 3.3 mW at a 0.9-V supply and scores a jitter-power figure-of-merit (FoM) of −241.9 dB. With a 103-MHz reference input, a bandwidth of ~20 MHz aids suppressing significantly the ring VCO’s phase noise (PN), leading to an in-band PN of −116 dBc/Hz at 1-MHz offset. The die size is 0.003 mm². [ABSTRACT FROM AUTHOR]