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Beam Damage by Transmission Electron Microscopy in FinFet Structures.

Authors :
Lian, Guoda
Ali, Malik
Boettcher, Steve
Bruley, John
Acoccella, Joyce
Yeow, Timothy
Tang, Dong
Alexandrou, Ioannis
Source :
Microscopy & Microanalysis; 2020 Supplement, Vol. 26 Issue S2, p1624-1625, 2p
Publication Year :
2020

Details

Language :
English
ISSN :
14319276
Volume :
26
Issue :
S2
Database :
Complementary Index
Journal :
Microscopy & Microanalysis
Publication Type :
Academic Journal
Accession number :
151139489
Full Text :
https://doi.org/10.1017/S1431927620018760