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Zinc and copper, by high sensitivity-low energy ion scattering.

Authors :
Avval, Tahereh G.
Průša, Stanislav
Chapman, Sean C.
Linford, Matthew R.
Šikola, Tomáš
Brongersma, Hidde H.
Source :
Surface Science Spectra; 2021, Vol. 28 Issue 1, p1-8, 8p
Publication Year :
2021

Abstract

Low energy ion scattering (LEIS) is an extremely surface sensitive technique that can quantitatively analyze the outermost atomic layer of a material. In LEIS and high sensitivity-low energy ion scattering (HS-LEIS), straightforward quantitation is available using reference and/or standard materials. Here, we present the HS-LEIS spectra of zinc obtained with 3 keV <superscript>4</superscript>He<superscript>+</superscript> and 4 keV <superscript>20</superscript>Ne<superscript>+</superscript> projectile ions. Zinc is an important material with a wide range of applications. Thus, these spectra should be useful standards/references for future applications. A high purity zinc foil was used for these measurements after the removal of the oxide layer. As a reference for the instrumental sensitivity, the spectra for Cu from a high purity foil are also included with this submission. Atomic sensitivity and relative sensitivity factors for Zn and Cu are reported. [ABSTRACT FROM AUTHOR]

Subjects

Subjects :
ION scattering
ION energy

Details

Language :
English
ISSN :
10555269
Volume :
28
Issue :
1
Database :
Complementary Index
Journal :
Surface Science Spectra
Publication Type :
Academic Journal
Accession number :
151232247
Full Text :
https://doi.org/10.1116/6.0000953