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In situ microscopy for plasma erosion of complex surfaces.
- Source :
- Review of Scientific Instruments; 2021, Vol. 92 Issue 7, p1-7, 7p
- Publication Year :
- 2021
-
Abstract
- A novel method for the in situ visualization and profilometry of a plasma-facing surface is demonstrated using a long-distance microscope. The technique provides valuable in situ monitoring of the microscopic temporal and morphological evolution of a material surface subject to plasma–surface interactions, such as ion-induced sputter erosion. Focus variation of image stacks enables height surface profilometry, which allows a depth of field beyond the limits associated with high magnification. As a demonstration of this capability, the erosion of a volumetrically featured aluminum foam is quantified during ion-bombardment in a low-temperature argon plasma where the electron temperature is ∼7 eV and the plasma is biased relative to the target surface such that ions impinge at ∼300 eV. Three-dimensional height maps are reconstructed from the images captured with a long-distance microscope with an x–y resolution of 3 × 3 μm<superscript>2</superscript> and a focus-variation resolution based on the motor step-size of 20 μm. The time-resolved height maps show a total surface recession of 730 μm and significant ligament thinning over the course of 330 min of plasma exposure. This technique can be used for developing plasma-facing components for a wide range of plasma devices for applications such as propulsion, manufacturing, hypersonics, and fusion. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00346748
- Volume :
- 92
- Issue :
- 7
- Database :
- Complementary Index
- Journal :
- Review of Scientific Instruments
- Publication Type :
- Academic Journal
- Accession number :
- 151705042
- Full Text :
- https://doi.org/10.1063/5.0043002