Trace‐element XAFS sensitivity: a stress test for a new XRF multi‐detector.

MLA

Carlomagno, Ilaria, et al. “Trace‐element XAFS Sensitivity: A Stress Test for a New XRF Multi‐detector.” Journal of Synchrotron Radiation, vol. 28, no. 6, Nov. 2021, pp. 1811–19. EBSCOhost, https://doi.org/10.1107/S1600577521008857.

APA

Carlomagno, I., Antonelli, M., Aquilanti, G., Bellutti, P., Bertuccio, G., Borghi, G., Cautero, G., Cirrincione, D., de Giudici, G., Ficorella, F., Gandola, M., Giuressi, D., Medas, D., Mele, F., Menk, R. H., Olivi, L., Orzan, G., Picciotto, A., Podda, F., & Rachevski, A. (2021). Trace‐element XAFS sensitivity: a stress test for a new XRF multi‐detector. Journal of Synchrotron Radiation, 28(6), 1811–1819. https://doi.org/10.1107/S1600577521008857

Chicago

Carlomagno, Ilaria, Matias Antonelli, Giuliana Aquilanti, Pierluigi Bellutti, Giuseppe Bertuccio, Giacomo Borghi, Giuseppe Cautero, et al. 2021. “Trace‐element XAFS Sensitivity: A Stress Test for a New XRF Multi‐detector.” Journal of Synchrotron Radiation 28 (6): 1811–19. doi:10.1107/S1600577521008857.