High resolution front-side visualization of charge stored in EEPROM with scanning nonlinear dielectric microscopy (SNDM).

MLA

Zeng, X. M., et al. “High Resolution Front-Side Visualization of Charge Stored in EEPROM with Scanning Nonlinear Dielectric Microscopy (SNDM).” Nanotechnology, vol. 32, no. 48, Nov. 2021, pp. 1–5. EBSCOhost, https://doi.org/10.1088/1361-6528/ac1ebd.

APA

Zeng, X. M., Liu, Q., Tay, J. Y., Chew, K. Y., Cheah, J., & Gan, C. L. (2021). High resolution front-side visualization of charge stored in EEPROM with scanning nonlinear dielectric microscopy (SNDM). Nanotechnology, 32(48), 1–5. https://doi.org/10.1088/1361-6528/ac1ebd

Chicago

Zeng, X M, Q Liu, J Y Tay, K Y Chew, J Cheah, and C L Gan. 2021. “High Resolution Front-Side Visualization of Charge Stored in EEPROM with Scanning Nonlinear Dielectric Microscopy (SNDM).” Nanotechnology 32 (48): 1–5. doi:10.1088/1361-6528/ac1ebd.