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A 1.2-Mpixel Indirect Time-of-Flight Image Sensor With 4-Tap 3.5- μ m Pixels for Peak Current Mitigation and Multi-User Interference Cancellation.

Authors :
Keel, Min-Sun
Kim, Daeyun
Kim, Yeomyung
Bae, Myunghan
Ki, Myoungoh
Chung, Bumsik
Son, Sooho
Lee, Hoyong
Shin, Seung-Chul
Kye, Myeonggyun
An, Jaeil
Kwon, Yonghun
Seo, Sungyoung
Cho, Sunghyuck
Kim, Youngchan
Jin, Young-Gu
Oh, Youngsun
Kim, Yitae
Ahn, Jungchak
Lee, Jesuk
Source :
IEEE Journal of Solid-State Circuits; Nov2021, Vol. 56 Issue 11, p3209-3219, 11p
Publication Year :
2021

Abstract

A 1.2-Mpixel indirect time-of-flight (ToF) CMOS image sensor is presented to lower peak current and to cancel out multi-user interference. The proposed 4-tap 3.5- $\mu \text{m}$ demodulation pixel is optimally designed to improve quantum efficiency (QE) and demodulation contrast (DC). A new “multiple-interleaving” scheme is proposed to reduce the peak current and self-compensate fixed-pattern phase noise (FPPN) with the minimal side effect of DC imbalance. To cancel out interference from the other ToF sensors, a multi-user interference cancellation (MUIC) scheme based on pseudorandom modulation is adopted. From the measurement results, we achieve a high QE of 38% at 940 nm and a high DC of 96% and 80% at 100- and 200-MHz modulation frequencies, respectively. With the superior pixel performance, the depth noise of <0.92% and <0.3% is achieved at the full and 2 $\times $ 2 binning modes, respectively. The multiple-interleaving scheme suppresses the peak current to less than 0.9 A and removes the column FPPN with constant DC for the whole pixel array. The proposed MUIC proves that at least two interferers can be successfully rejected. The sensor chip is fabricated in a two-stack process with 65 nm for the top die and 65 nm for the bottom die. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189200
Volume :
56
Issue :
11
Database :
Complementary Index
Journal :
IEEE Journal of Solid-State Circuits
Publication Type :
Academic Journal
Accession number :
153730532
Full Text :
https://doi.org/10.1109/JSSC.2021.3112405