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A Robust and Efficient Compact Model for Phase-Change Memory Circuit Simulations.

Authors :
Chen, Xuhui
Ding, Feilong
Huang, Xiaoqing
Lin, Xinnan
Wang, Runsheng
Chan, Mansun
Zhang, Lining
Huang, Ru
Source :
IEEE Transactions on Electron Devices; Sep2021, Vol. 68 Issue 9, p4404-4410, 7p
Publication Year :
2021

Abstract

A phase-change memory (PCM) model for robust and efficient simulations of circuits including neuromorphic ones is reported in this work. The features of a hysteretic dynamic resistance in the voltage domain, and the incubation in the crystallization, are covered in the model. The Landau–Khalatnikov (LK)-type equation for ferroelectric is used to develop the PCM hysteresis module. A voltage-controlled relaxation oscillation is successfully simulated for the Ge2Sb2Te5 (GST) PCM. A technique of direct evaluation (DE) is then developed to reformulate the PCM model without any internal node. A significant enhancement of simulation efficiency is achieved compared with the traditional approach without sacrificing the accuracy. The functional correctness of the PCM device model and the acceleration effect in circuit simulations are verified. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189383
Volume :
68
Issue :
9
Database :
Complementary Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
153763968
Full Text :
https://doi.org/10.1109/TED.2021.3098656