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Near-infrared fringe projection profilometry based on deep learning.

Authors :
Wang, Jinglei
Li, Yixuan
Wang, Mengke
Zhang, Yanxin
Jia, Zhe
Zhang, Yuzhen
Source :
Proceedings of SPIE; 2/5/2022, Vol. 12069, p1206909-1206909, 1p
Publication Year :
2022

Details

Language :
English
ISSN :
0277786X
Volume :
12069
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
154292371
Full Text :
https://doi.org/10.1117/12.2605009