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An ISI Scrambling Technique for Dynamic Element Matching Current-Steering DACs.

Authors :
Remple, Jason
Panigada, Andrea
Galton, Ian
Source :
IEEE Journal of Solid-State Circuits; Feb2022, Vol. 57 Issue 2, p465-479, 15p
Publication Year :
2022

Abstract

The linearity of high-resolution current-steering digital-to-analog converters (DACs) is often limited by inter-symbol interference (ISI). While dynamic element matching (DEM) can be applied to convert a portion of the ISI to uncorrelated noise instead of nonlinear distortion, DEM alone fails to prevent ISI from at least introducing strong second-order nonlinear distortion. This paper addresses this problem by proposing, analyzing, and experimentally demonstrating a low-cost add-on technique, called ISI scrambling, that, in conjunction with DEM, causes a DAC’s ISI to be free of nonlinear distortion. The ISI scrambling technique is demonstrated in a 1-GS/s, 14-bit DEM DAC implemented in 90 nm CMOS technology. The DAC’s measured linearity is in line with the state-of-the-art and its measured output power spectra closely match those predicted by this paper’s theoretical results. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189200
Volume :
57
Issue :
2
Database :
Complementary Index
Journal :
IEEE Journal of Solid-State Circuits
Publication Type :
Academic Journal
Accession number :
154974510
Full Text :
https://doi.org/10.1109/JSSC.2021.3085587