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High-Throughput and Energy-Efficient VLSI Architecture for Ordered Reliability Bits GRAND.

Authors :
Abbas, Syed Mohsin
Tonnellier, Thibaud
Ercan, Furkan
Jalaleddine, Marwan
Gross, Warren J.
Source :
IEEE Transactions on Very Large Scale Integration (VLSI) Systems; Jun2022, Vol. 30 Issue 6, p681-693, 13p
Publication Year :
2022

Abstract

Ultrareliable low-latency communication (URLLC), a major 5G new-radio (NR) use case, is the key enabler for applications with strict reliability and latency requirements. These applications necessitate the use of short-length and high-rate channel codes. Guessing random additive noise decoding (GRAND) is a recently proposed maximum likelihood (ML) decoding technique for these short-length and high-rate codes. Rather than decoding the received vector, GRAND tries to infer the noise that corrupted the transmitted codeword during transmission through the communication channel. As a result, GRAND can decode any code, structured or unstructured. GRAND has hard-input as well as soft-input variants. Among these variants, ordered reliability bits GRAND (ORBGRAND) is a soft-input variant that outperforms hard-input GRAND and is suitable for parallel hardware implementation. This work reports the first hardware architecture for ORBGRAND, which achieves an average throughput of up to 42.5 Gb/s for a code length of 128 at a target frame error rate (FER) of 10−7. Furthermore, the proposed hardware can be used to decode any code as long as the length and rate constraints are met. In comparison to the GRAND with ABandonment (GRANDAB), a hard-input variant of GRAND, the proposed architecture enhances decoding performance by at least 2 dB. When compared to the state-of-the-art fast dynamic successive cancellation flip decoder (Fast-DSCF) using a 5G polar code (PC) (128, 105), the proposed ORBGRAND VLSI implementation has $49\times $ higher average throughput, $32\times $ times more energy efficiency, and $5\times $ more area efficiency while maintaining similar decoding performance. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
10638210
Volume :
30
Issue :
6
Database :
Complementary Index
Journal :
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Publication Type :
Academic Journal
Accession number :
156931455
Full Text :
https://doi.org/10.1109/TVLSI.2022.3153605