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High-Throughput and Energy-Efficient VLSI Architecture for Ordered Reliability Bits GRAND.
- Source :
- IEEE Transactions on Very Large Scale Integration (VLSI) Systems; Jun2022, Vol. 30 Issue 6, p681-693, 13p
- Publication Year :
- 2022
-
Abstract
- Ultrareliable low-latency communication (URLLC), a major 5G new-radio (NR) use case, is the key enabler for applications with strict reliability and latency requirements. These applications necessitate the use of short-length and high-rate channel codes. Guessing random additive noise decoding (GRAND) is a recently proposed maximum likelihood (ML) decoding technique for these short-length and high-rate codes. Rather than decoding the received vector, GRAND tries to infer the noise that corrupted the transmitted codeword during transmission through the communication channel. As a result, GRAND can decode any code, structured or unstructured. GRAND has hard-input as well as soft-input variants. Among these variants, ordered reliability bits GRAND (ORBGRAND) is a soft-input variant that outperforms hard-input GRAND and is suitable for parallel hardware implementation. This work reports the first hardware architecture for ORBGRAND, which achieves an average throughput of up to 42.5 Gb/s for a code length of 128 at a target frame error rate (FER) of 10−7. Furthermore, the proposed hardware can be used to decode any code as long as the length and rate constraints are met. In comparison to the GRAND with ABandonment (GRANDAB), a hard-input variant of GRAND, the proposed architecture enhances decoding performance by at least 2 dB. When compared to the state-of-the-art fast dynamic successive cancellation flip decoder (Fast-DSCF) using a 5G polar code (PC) (128, 105), the proposed ORBGRAND VLSI implementation has $49\times $ higher average throughput, $32\times $ times more energy efficiency, and $5\times $ more area efficiency while maintaining similar decoding performance. [ABSTRACT FROM AUTHOR]
- Subjects :
- VERY large scale circuit integration
CHANNEL coding
Subjects
Details
- Language :
- English
- ISSN :
- 10638210
- Volume :
- 30
- Issue :
- 6
- Database :
- Complementary Index
- Journal :
- IEEE Transactions on Very Large Scale Integration (VLSI) Systems
- Publication Type :
- Academic Journal
- Accession number :
- 156931455
- Full Text :
- https://doi.org/10.1109/TVLSI.2022.3153605