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A 4-Mb Toggle MRAM Based on a Novel Bit and Switching Method.

Authors :
Engel, B. N.
Åkerman, J.
Butcher, B.
Dave, R. W.
Deherrera, M.
Durlam, M.
Grynkewich, G.
Janesky, J.
Pietambaram, S. V.
Rizzo, N. D.
Slaughter, J. M.
Smith, K.
Sun, J. J.
Tehrani, S.
Source :
IEEE Transactions on Magnetics; Jan2005 Part 1 of 2, Vol. 41 Issue 1, p132-136, 5p
Publication Year :
2005

Abstract

Abstract-A 4-Mb magnetoresistive random access memory (MRAM) with a novel magnetic bit cell and toggle switching mode is presented. The circuit was designed in a five level metal, 0.18-μm complementary metal-oxide-semiconductor process with a bit cell size of 1.55 μm². The new bit cell uses a balanced synthetic antiferromagnetic free layer and a phased write pulse sequence to provide robust switching performance with immunity from half-select disturbs. This switching mode greatly improves the operational performance of the MRAM as compared to conventional MRAM. Adetailed description of this 4-Mb toggle MRAM is presented. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189464
Volume :
41
Issue :
1
Database :
Complementary Index
Journal :
IEEE Transactions on Magnetics
Publication Type :
Academic Journal
Accession number :
15828469
Full Text :
https://doi.org/10.1109/TMAG.2004.840847