Physical Insight into Self-heating Induced Performance Degradation in RingFET.

MLA

Singh, Sahil, et al. “Physical Insight into Self-Heating Induced Performance Degradation in RingFET.” SILICON (1876990X), vol. 14, no. 13, Aug. 2022, pp. 7585–93. EBSCOhost, https://doi.org/10.1007/s12633-021-01491-9.

APA

Singh, S., Srinivas, P. S. T. N., Kumar, A., & Tiwari, P. K. (2022). Physical Insight into Self-heating Induced Performance Degradation in RingFET. SILICON (1876990X), 14(13), 7585–7593. https://doi.org/10.1007/s12633-021-01491-9

Chicago

Singh, Sahil, P. S. T. N. Srinivas, Arun Kumar, and Pramod Kumar Tiwari. 2022. “Physical Insight into Self-Heating Induced Performance Degradation in RingFET.” SILICON (1876990X) 14 (13): 7585–93. doi:10.1007/s12633-021-01491-9.