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Progress Towards More Accurate and Precise MicroED Measurements.

Authors :
Mecklenburg, Matthew
Saha, Ambarneil
Source :
Microscopy & Microanalysis; 2022 Supplement, Vol. 28, p1072-1073, 2p
Publication Year :
2022

Details

Language :
English
ISSN :
14319276
Volume :
28
Database :
Complementary Index
Journal :
Microscopy & Microanalysis
Publication Type :
Academic Journal
Accession number :
159538166
Full Text :
https://doi.org/10.1017/S1431927622004548