Back to Search Start Over

Isogency Hosmer–Lemeshow Logistic Regression-Based Secured Information Sharing for Pharma Supply Chain.

Authors :
P, Anitha
Chandrasekaran, Srimathi
Source :
Electronics (2079-9292); Oct2022, Vol. 11 Issue 19, p3170, 16p
Publication Year :
2022

Abstract

Counterfeit drugs are forgery-tagged medicines that are considered to be drugs without vigorous active pharmaceutical ingredients (API). India, being the world's largest producer of drugs, faces a crucial issue of counterfeits. Moreover, counterfeits identify their path into the pharmaceutical supply chain (PSC) effortlessly owing to the dearth of security and traceability in the prevailing system. This is because the software applications currently in use stockpile the information about drugs on centralized servers and are accessed by manufacturers, distributors and retailers via the internet. The security of such systems is found to be weak. To address these issues, in this work, a novel method called Supersingular Isogeny and Hosmer–Lemeshow Logistic Regression-based (SI-HLLR) secured information sharing for the pharmaceutical supply chain is proposed. The SI-HLLR method is split into two sections, block validation and authentication. First, with the pharmaceutical sales data provided as input, the supersingular isogeny Diffie–Hellman key exchange model is applied for block validation and then is implemented using a blockchain. Next, with the validated blocks, the authentication mechanism is performed using Hosmer–Lemeshow logistic regression-based authentication that in turn eliminates the counterfeit drugs from the pharmaceutical supply chain. The hyperledger fabric blockchain solution using SI-HLLR leads to improved security ensuring data integrity and better authentication accuracy in the proposed method. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
20799292
Volume :
11
Issue :
19
Database :
Complementary Index
Journal :
Electronics (2079-9292)
Publication Type :
Academic Journal
Accession number :
159673650
Full Text :
https://doi.org/10.3390/electronics11193170