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Radiation Shielding, EPR, and TL Mechanism in Cr3+: Ba(La)2SiO6 Glass Ceramics.
- Source :
- SILICON (1876990X); Oct2022, Vol. 14 Issue 15, p9887-9899, 13p
- Publication Year :
- 2022
-
Abstract
- The current research aimed to prepare the Cr<subscript>2</subscript>O<subscript>3</subscript> doped Ba(La)<subscript>2</subscript>SiO<subscript>6</subscript> glasses and planned for elastic, radiation shielding, electron paramagnetic resonance, and thermoluminescence characterization. The X-Ray diffraction reports reveal the glassy behavior of the pure glass. At the same time, the other test samples show ceramic behavior. Mechanical properties of test samples reveal the range of the microhardness. DTA studies reveal the values of thermal studies of the test samples. After that, the glass-ceramics were tested for radiation shielding properties. The values of mass attenuation coefficient and radiation protection efficiency of the glasses are measured and compared with values obtained with the help of standard photon shielding and dosimetry software. The studies indicate that the glasses developed are capable of radiation shielding. The electron paramagnetic resonance reports suggest high dipole-dipole super-exchange interaction and rhombohedral distortion within the glasses. Furthermore, we have tested the glasses for radiation shielding properties. Upon 50 kGy, γ - irradiation, the thermoluminescence properties of the glasses are reported. The results were exciting and revealed that the resource developed is thermoluminescent at low activation energies. Additionally, the electron paramagnetic resonance and thermoluminescence properties obtained for the glasses are highly interlinked. In this view, to initiate the comprehensive link between electron paramagnetic resonance and thermoluminescence phenomenon, we have annealed the glasses under 0 to 300 °C of temperature and upon the 0 to 50 kGy, γ - irradiation dose level. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 1876990X
- Volume :
- 14
- Issue :
- 15
- Database :
- Complementary Index
- Journal :
- SILICON (1876990X)
- Publication Type :
- Academic Journal
- Accession number :
- 160089345
- Full Text :
- https://doi.org/10.1007/s12633-022-01731-6