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A ReRAM-Based Non-Volatile and Radiation-Hardened Latch Design.
- Source :
- Micromachines; Nov2022, Vol. 13 Issue 11, p1802, 11p
- Publication Year :
- 2022
-
Abstract
- In aerospace environments, high reliability and low power consumption of chips are essential. To greatly reduce power consumption, the latches of a chip need to enter the power down operation. In this operation, employing non-volatile (NV) latches can retain circuit states. Moreover, a latch can be hit by a radiative particle in the aerospace environment, which can cause a severe soft error in the worst case. This paper presents a NV-latch based on resistive random-access memories (ReRAMs) for NV and robust applications. The proposed NV-latch is radiation-hardened with low overhead and can restore values after power down operation. Simulation results demonstrate that the proposed NV-latch can completely provide radiation hardening capability against single-event upsets (SEUs) and can restore values after power down operation. The proposed NV-latch can reduce the number of transistors in the storage cells by 50% on average compared with the other similar solutions. [ABSTRACT FROM AUTHOR]
- Subjects :
- LOW voltage integrated circuits
RANDOM access memory
SOFT errors
Subjects
Details
- Language :
- English
- ISSN :
- 2072666X
- Volume :
- 13
- Issue :
- 11
- Database :
- Complementary Index
- Journal :
- Micromachines
- Publication Type :
- Academic Journal
- Accession number :
- 160206010
- Full Text :
- https://doi.org/10.3390/mi13111802