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Machine learning-based analyses for total ionizing dose effects in bipolar junction transistors.
- Source :
- Nuclear Science & Techniques; Oct2022, Vol. 33 Issue 10, p1-11, 11p
- Publication Year :
- 2022
Details
- Language :
- English
- ISSN :
- 10018042
- Volume :
- 33
- Issue :
- 10
- Database :
- Complementary Index
- Journal :
- Nuclear Science & Techniques
- Publication Type :
- Academic Journal
- Accession number :
- 160349979
- Full Text :
- https://doi.org/10.1007/s41365-022-01107-w