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An On-Chip Relaxation Oscillator in 5-nm FinFET Using a Frequency-Error Feedback Loop.

Authors :
Mehta, Nandish
Tell, Stephen G.
Turner, Walker J.
Tatro, Lamar
Goh, Jih-Ren
Gray, C. Thomas
Source :
IEEE Journal of Solid-State Circuits; Oct2022, Vol. 57 Issue 10, p2898-2908, 11p
Publication Year :
2022

Abstract

Availability of a reliable ON-chip oscillator can secure a system-on-chip (SoC) against physical clock attacks by enabling applications such as boot-up using ON-chip oscillator and hardware clock monitors. This article proposes a frequency-error feedback (FEF) loop-based relaxation oscillator for such applications. It suppresses the low-frequency noise and improves the time interval error (TIE) without degrading the period jitter. It also stabilizes the oscillator against supply and temperature variations. A 77-MHz oscillator prototype is fabricated in a commercial 5-nm FinFET process. Operating from 0.9-V digital and 1.2-V analog supplies, the prototype consumes a total of 0.84 mW and occupies an area of 0.0152 mm 2. It achieves a TIE of 3 ns over 10 K cycles which is $3\times $ better than an oscillator without an FEF loop. Chip samples are picked from four wafer split lots. The worst case frequency variation measured from 16 samples is $\pm 0.25\%$ across an analog supply change of 1.1–1.35 V, while a variation of $\pm 0.3\%$ is measured over −40 to $125 ^\circ \text{C}$ temperature from eight samples. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189200
Volume :
57
Issue :
10
Database :
Complementary Index
Journal :
IEEE Journal of Solid-State Circuits
Publication Type :
Academic Journal
Accession number :
160620752
Full Text :
https://doi.org/10.1109/JSSC.2022.3183208