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Interface Capture Effect Printing Atomicā€Thick 2D Semiconductor Thin Films.

Authors :
Li, Lihong
Yu, Xiaoxia
Lin, Zhaoyang
Cai, Zhenren
Cao, Yawei
Kong, Wei
Xiang, Zhongyuan
Gu, Zhengkun
Xing, Xianran
Duan, Xiangfeng
Song, Yanlin
Source :
Advanced Materials; 12/8/2022, Vol. 34 Issue 49, p1-10, 10p
Publication Year :
2022

Details

Language :
English
ISSN :
09359648
Volume :
34
Issue :
49
Database :
Complementary Index
Journal :
Advanced Materials
Publication Type :
Academic Journal
Accession number :
160718833
Full Text :
https://doi.org/10.1002/adma.202207392