Research on Wickerwork Patterns Creative Design and Development Based on Style Transfer Technology.

Traditional craftsmanship and culture are facing a transformation in modern science and technology development, and the cultural industry is gradually stepping into the digital era, which can realize the sustainable development of intangible cultural heritage with the help of digital technology. To innovatively generate wickerwork pattern design schemes that meets the user's preferences, this study proposes a design method of wickerwork patterns based on a style migration algorithm. First, an image recognition experiment using residual network (ResNet) based on the convolutional neural network is applied to the Funan wickerwork patterns to establish an image recognition model. The experimental results illustrate that the optimal recognition rate is 93.37% for the entire dataset of ResNet50 of the pattern design images, where the recognition rate of modern patterns is 89.47%, while the recognition rate of traditional patterns is 97.14%, the recognition rate of wickerwork patterns is 95.95%, and the recognition rate of personality is 90.91%. Second, based on Cycle-Consistent Adversarial Networks (CycleGAN) to build design scheme generation models of the Funan wickerwork patterns, CycleGAN can automatically and innovatively generate the pattern design scheme that meets certain style characteristics. Finally, the designer uses the creative images as the inspiration source and participates in the detailed adjustment of the generated images to design the wickerwork patterns with various stylistic features. This proposed method could explore the application of AI technology in wickerwork pattern development, and providing more comprehensive and rich new material for the creation of wickerwork patterns, thus contributing to the sustainable development and innovation of traditional Funan wickerwork culture. In fact, this digital technology can empower the inheritance and development of more intangible cultural heritages. [ABSTRACT FROM AUTHOR]