Secondary Electron Contrast in STEM Electron Beam-Induced Current (EBIC): a Path Towards Mapping Electronic Structure.

Details

Language :

English

ISSN :

14319276

Database :

Complementary Index

Journal :

Microscopy & Microanalysis

Publication Type :

Academic Journal

Accession number :

163213006

Full Text :

https://doi.org/10.1017/S1431927618009716