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An open circuit fault identification method of inverter based on FDA-KNN.

Authors :
Shen, Xueli
Gu, Xiaowei
Source :
Proceedings of SPIE; 9/2/2023, Vol. 12642, p126422R-126422R-8, 1p
Publication Year :
2023

Details

Language :
English
ISSN :
0277786X
Volume :
12642
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
163563894
Full Text :
https://doi.org/10.1117/12.2674718