Cite
Probing into Reverse Bias Dark Current in Perovskite Photodiodes: Critical Role of Surface Defects.
MLA
Yin, Zhao‐Yang, et al. “Probing into Reverse Bias Dark Current in Perovskite Photodiodes: Critical Role of Surface Defects.” Advanced Functional Materials, vol. 33, no. 33, Aug. 2023, pp. 1–8. EBSCOhost, https://doi.org/10.1002/adfm.202302199.
APA
Yin, Z., Chen, Y., Zhang, Y., Yuan, Y., Yang, Q., Zhong, Y., Gao, X., Xiao, J., Wang, Z., Xu, J., & Wang, S. (2023). Probing into Reverse Bias Dark Current in Perovskite Photodiodes: Critical Role of Surface Defects. Advanced Functional Materials, 33(33), 1–8. https://doi.org/10.1002/adfm.202302199
Chicago
Yin, Zhao‐Yang, Yang Chen, Yang‐Yang Zhang, Yu Yuan, Qian Yang, Ya‐Nan Zhong, Xu Gao, et al. 2023. “Probing into Reverse Bias Dark Current in Perovskite Photodiodes: Critical Role of Surface Defects.” Advanced Functional Materials 33 (33): 1–8. doi:10.1002/adfm.202302199.