Cite
P‐157: Late‐News Poster: Understanding of degradation process by voltage‐sweep loop method in exciplex host‐based phosphorescent organic light‐emitting diodes.
MLA
Lee, Hakjun, and Taekyung Kim. “P‐157: Late‐News Poster: Understanding of Degradation Process by Voltage‐sweep Loop Method in Exciplex Host‐based Phosphorescent Organic Light‐emitting Diodes.” SID Symposium Digest of Technical Papers, vol. 54, no. 1, June 2023, pp. 1346–49. EBSCOhost, https://doi.org/10.1002/sdtp.16832.
APA
Lee, H., & Kim, T. (2023). P‐157: Late‐News Poster: Understanding of degradation process by voltage‐sweep loop method in exciplex host‐based phosphorescent organic light‐emitting diodes. SID Symposium Digest of Technical Papers, 54(1), 1346–1349. https://doi.org/10.1002/sdtp.16832
Chicago
Lee, Hakjun, and Taekyung Kim. 2023. “P‐157: Late‐News Poster: Understanding of Degradation Process by Voltage‐sweep Loop Method in Exciplex Host‐based Phosphorescent Organic Light‐emitting Diodes.” SID Symposium Digest of Technical Papers 54 (1): 1346–49. doi:10.1002/sdtp.16832.