P‐149: Late‐News Poster: Effective Approach to Failure Analysis of IC‐embedded OLED Display Device.

With conventional methodologies and workflow in the failure analysis (FA) of display device, the result of FA was not clear enough to identify the defect source because it had been removed or deformed during PFA work. Therefore, new methodologies and workflow were proposed to resolve the limitations of current ones. This study with actual FA works of display failures like abnormal display failure and vertical line display failure, verified that the FA of display failure at module level successfully identified the source of defectivity without its alteration during PFA work. New methodologies and workflow would contribute to clear identification of failure source so that it gives feedback into inline, followed by improvement actions. [ABSTRACT FROM AUTHOR]