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Improving the accuracy and precision of OCD measurement by systematic error correction in self-interference pupil ellipsometry.

Authors :
Lee, Seungwoo
Park, Yeeun
Lee, Seungryeol
Chang, Hoonchul
Jung, Jaehwang
Shin, Inho
Jeong, Seoyeon
Lee, Sooyeong
Ahn, Jinwoo
Kim, Taejoong
Jo, Taeyong
Lee, Myungjun
Source :
Proceedings of SPIE; 8/9/2023, Vol. 12618, p126180B-126180B-18, 1p
Publication Year :
2023

Details

Language :
English
ISSN :
0277786X
Volume :
12618
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
171307449
Full Text :
https://doi.org/10.1117/12.2677195