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A High‐Entropy‐Oxides‐Based Memristor: Outstanding Resistive Switching Performance and Mechanisms in Atomic Structural Evolution.

Authors :
Tsai, Jing‐Yuan
Chen, Jui‐Yuan
Huang, Chun‐Wei
Lo, Hung‐Yang
Ke, Wei‐En
Chu, Ying‐Hao
Wu, Wen‐Wei
Source :
Advanced Materials; 10/12/2023, Vol. 35 Issue 41, p1-9, 9p
Publication Year :
2023

Details

Language :
English
ISSN :
09359648
Volume :
35
Issue :
41
Database :
Complementary Index
Journal :
Advanced Materials
Publication Type :
Academic Journal
Accession number :
172959972
Full Text :
https://doi.org/10.1002/adma.202302979