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Site-specific Transmission Electron Microscope Characterization of Micrometer-sized Particles Using the Focused Ion Beam Lift-out Technique.
- Source :
- Microscopy & Microanalysis; 2001, Vol. 7 Issue 5, p418-423, 7p
- Publication Year :
- 2001
Details
- Language :
- English
- ISSN :
- 14319276
- Volume :
- 7
- Issue :
- 5
- Database :
- Complementary Index
- Journal :
- Microscopy & Microanalysis
- Publication Type :
- Academic Journal
- Accession number :
- 173107840
- Full Text :
- https://doi.org/10.1007/s10005-001-0016-0