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Blind Super-Resolution Network with Dual-Channel Attention for Images Captured by Sub-Millimeter-Diameter Fiberscope.
- Source :
- Electronics (2079-9292); Oct2023, Vol. 12 Issue 20, p4352, 12p
- Publication Year :
- 2023
-
Abstract
- A blind super-resolution network with dual-channel attention is proposed for images captured by the 0.37 mm diameter sub-millimeter fiberscope. The fiberscope can used in scenarios where other image acquisition devices cannot be applied based on its flexible, soft, and minimally invasive characteristics. However, the images have black reticulated noise and only 3000 pixels. To improve image quality, the Butterworth band-stop filter is used to reduce the frequency of the reticulated noise. By optimizing the blind super-resolution model, high-quality images can be reconstructed that do not require a lot of synthetic paired fiberscope image data. Perceptual loss is utilized as a loss function, and channel and spatial attention mechanisms are introduced to the model to enhance the high-frequency detail information of the reconstructed image. In the comparative experiment with other methods, our method showed improvements of 2.25 in peak signal-to-noise ratio (PSNR) and 0.09 in structural similarity (SSIM) based on objective evaluation metrics. The learned perceptual image patch similarity (LPIPS) based on learning was reduced by 0.6. Furthermore, four different methods were used to enhance the resolution of the fiberscope images by a factor of four. The results of this paper improve the information entropy and Laplace clarity by 0.44 and 2.54, respectively, compared to the average of other methods. Validation results show that the approach in this paper is more applicable to sub-millimeter-diameter fiberscopes. [ABSTRACT FROM AUTHOR]
- Subjects :
- SIGNAL-to-noise ratio
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Subjects
Details
- Language :
- English
- ISSN :
- 20799292
- Volume :
- 12
- Issue :
- 20
- Database :
- Complementary Index
- Journal :
- Electronics (2079-9292)
- Publication Type :
- Academic Journal
- Accession number :
- 173263805
- Full Text :
- https://doi.org/10.3390/electronics12204352