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Leveraging Machine Learning for Capacity and Cost on a Complex Toolset: A Case Study.

Authors :
Kalir, Adar A.
Lo, Sin Kit
Goldberg, Gavan
Zingerman-Koladko, Irena
Ohana, Aviv
Revah, Yossi
Chimol, Tsvi Ben
Honig, Gavriel
Source :
IEEE Transactions on Semiconductor Manufacturing; Nov2023, Vol. 36 Issue 4, p611-618, 8p
Publication Year :
2023

Abstract

In this case study, we introduce two ML techniques, Long Short-Term Memory (LSTM) and an optimized Random Forest (RF), to address challenges related to capacity and cost, by addressing problems of unscheduled downtime and Process Time (PT) variation in the case of a complex chamber processing tool. We show that by using these ML techniques, traditional methods of Predictive Maintenance (PdM) and PT analysis can be enhanced with new insights and lead to significant productivity improvements. We demonstrate that, with these methods, by detecting states and attributes of the tool, trends in the tool’s behavior can be more effectively identified to reduce its unscheduled downtime and improve its run-rate, thereby resulting in significant capacity and cost improvements. This is achieved by reducing the variability of availability; extending the Mean Time Between Failures (MTBF); and removing variability in PT between lots and chambers. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
08946507
Volume :
36
Issue :
4
Database :
Complementary Index
Journal :
IEEE Transactions on Semiconductor Manufacturing
Publication Type :
Academic Journal
Accession number :
173370012
Full Text :
https://doi.org/10.1109/TSM.2023.3314431