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Toward real application of quantum sensing and metrology.

Authors :
Takeshi Ohshima
Source :
Frontiers in Quantum Science & Technology; 2023, p1-3, 3p
Publication Year :
2023

Abstract

The article explores the field of quantum sensing and metrology, which allows for highly sensitive measurements of various factors. Quantum sensors can observe information at the nanometer scale, but further advancements are needed in materials and control methods. The article highlights the potential of quantum sensing and metrology in various fields. It also discusses a study on the creation of position-controlled color centers in a silicon carbide pn junction diode, which has implications for quantum science and technology. [Extracted from the article]

Details

Language :
English
ISSN :
28132181
Database :
Complementary Index
Journal :
Frontiers in Quantum Science & Technology
Publication Type :
Academic Journal
Accession number :
174540985
Full Text :
https://doi.org/10.3389/frqst.2022.998459