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Effect of PVD-coated wall aperture roughness on the life span of fine-pitch stencil printing.

Authors :
Mohamed Sunar, Mohamad Solehin
Abu Bakar, Maria
A., Atiqah
Jalar, Azman
Muhamed Mukhtar, Muhamed Abdul Fatah
Che Ani, Fakhrozi
Source :
Soldering & Surface Mount Technology; 2024, Vol. 36 Issue 1, p51-59, 9p
Publication Year :
2024

Abstract

Purpose: This paper aims to investigate the effect of physical vapor deposition (PVD)-coated stencil wall aperture on the life span of fine-pitch stencil printing. Design/methodology/approach: The fine-pitch stencil used in this work is fabricated by electroform process and subsequently nano-coated using the PVD process. Stencil printing process was then performed to print the solder paste onto the printed circuit board (PCB) pad. The solder paste release was observed by solder paste inspection (SPI) and analyzed qualitatively and quantitatively. The printing cycle of up to 80,000 cycles was used to investigate the life span of stencil printing. Findings: The finding shows that the performance of stencil printing in terms of solder printing quality is highly dependent on the surface roughness of the stencil aperture. PVD-coated stencil aperture can prolong the life span of stencil printing with an acceptable performance rate of about 60%. Originality/value: Stencil printing is one of the important processes in surface mount technology to apply solder paste on the PCB. The stencil's life span greatly depends on the type of solder paste, stencil printing cycles involved and stencil conditions such as the shape of the aperture, size and thickness of the stencil. This study will provide valuable insight into the relationship between the coated stencil wall aperture via PVD process on the life span of fine-pitch stencil printing. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
09540911
Volume :
36
Issue :
1
Database :
Complementary Index
Journal :
Soldering & Surface Mount Technology
Publication Type :
Academic Journal
Accession number :
174691751
Full Text :
https://doi.org/10.1108/SSMT-05-2023-0025