Cite
AnomalySeg: Deep Learning-Based Fast Anomaly Segmentation Approach for Surface Defect Detection.
MLA
Song, Yongxian, et al. “AnomalySeg: Deep Learning-Based Fast Anomaly Segmentation Approach for Surface Defect Detection.” Electronics (2079-9292), vol. 13, no. 2, Jan. 2024, p. 284. EBSCOhost, https://doi.org/10.3390/electronics13020284.
APA
Song, Y., Xia, W., Li, Y., Li, H., Yuan, M., & Zhang, Q. (2024). AnomalySeg: Deep Learning-Based Fast Anomaly Segmentation Approach for Surface Defect Detection. Electronics (2079-9292), 13(2), 284. https://doi.org/10.3390/electronics13020284
Chicago
Song, Yongxian, Wenhao Xia, Yuanyuan Li, Hao Li, Minfeng Yuan, and Qi Zhang. 2024. “AnomalySeg: Deep Learning-Based Fast Anomaly Segmentation Approach for Surface Defect Detection.” Electronics (2079-9292) 13 (2): 284. doi:10.3390/electronics13020284.